Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method

Seizo Morita; Noriaki Oyabu; Ryuji Nishi; Kenji Okamoto; Masayuki Abe; Óscar Custance; Insook Yi; Yoshihide Seino; Yasuhiro Sugawara

doi:10.1380/ejssnt.2003.158

Conference Papers -ALC'03-

Atom Selective Imaging and Mechanical Atom Manipulation based on Noncontact Atomic Force Microscope Method

Seizo Morita, Noriaki Oyabu, Ryuji Nishi, Kenji Okamoto, Masayuki Abe, Óscar Custance, Insook Yi, Yoshihide Seino, Yasuhiro Sugawara

Author information

Seizo Morita
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
Handai Frontier Research Center (FRC)
Noriaki Oyabu
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
Handai Frontier Research Center (FRC)
Ryuji Nishi
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
Kenji Okamoto
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
Masayuki Abe
Department of Electronic Engineering, Graduate School of Engineering, Osaka University
Óscar Custance
Handai Frontier Research Center (FRC)
Insook Yi
Handai Frontier Research Center (FRC)
Yoshihide Seino
Handai Frontier Research Center (FRC)
Yasuhiro Sugawara
Handai Frontier Research Center (FRC)
Department of Applied Physics, Graduate School of Engineering, Osaka University

Keywords: Atomic force microscopy, Atom/molecule manipulation, Surface structure, morphology, roughness, and topography, Silicon, Silver

JOURNAL FREE ACCESS

2003 Volume 1 Pages 158-170

DOI https://doi.org/10.1380/ejssnt.2003.158

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Abstract

We investigated performances and functions of the noncontact atomic force microscope (NC-AFM) method. As a result, we found that the NC-AFM functions not only as the atomic resolution microscope but also novel atomic tools based on a mechanical method as follows; a three-dimensional mapping tool of atomic force between the tip and sample atoms, a discrimination tool of atomic force mechanisms and atom species of the sample surface, a control tool of atomic force and atom position on the sample surface, and an atom manipulation tool. [DOI: 10.1380/ejssnt.2003.158]

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