e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-4-
EXAFS Study of the Local Structure for Semimetal-Semiconductor Transition in Bismuth Clusters
Hiroyuki IkemotoKeisuke DetoTakafumi Miyanaga
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2005 Volume 3 Pages 370-372

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Abstract

Extended X-ray absorption fine structure (EXAFS) measurements were carried out in order to investigate the phase transition of bismuth clusters from semi-metallic nanocrystal to semiconducting amorphousness depending on the size. XAFS functions were Fourier-transformed and analyzed by the curve fitting method. The peaks around 3.0 Å and 3.6 Å are attributed to the nearest neighbors within the the layer and between the interlayer, respectively. In the 0.5 nm thick films the covalent bond length within the layer slightly shortens and the peak originated from the interlayer disappears. [DOI: 10.1380/ejssnt.2005.370]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
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