e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ALC05-
Local electronic structure analysis using a photoelectron emission microscope (PEEM) with hard X-ray
M. KotsugiT. WakitaT. TaniuchiK. OnoM. SuzukiN. KawamuraM. TakagakiM. TaniguchiK. KobayashiM. OshimaN. IshimatsuH. Maruyama
Author information
JOURNAL FREE ACCESS

2006 Volume 4 Pages 490-493

Details
Abstract

We demonstrate a new use for photoelectron emission microscopy (PEEM) in combination with hard X-ray synchrotron radiation. With this technique, an X-ray absorption fine structure spectrum can be acquired on each pixel in the observed image, thereby enabling analysis of the electronic properties in nanometer scale. Here, we report the local chemical composition and electronic structure of the Widmanstätten pattern in the Gibeon iron meteorite and clarify that the α lamella exhibits bcc structure with a spatially homogeneous Fe concentration. [DOI: 10.1380/ejssnt.2006.490]

Content from these authors

この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
Previous article Next article
feedback
Top