Regular Papers
Theoretical characterization of reflector-assisted TXRF analysis
2006 Volume 4 Pages 579-583
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2006 Volume 4 Pages 579-583
The intensity enhancement phenomenon in reflector assisted TXRF has been investigated theoretically. Intensity enhancement effect was presented by focusing of primary and reflected X-ray beam to the sample. Proposed explanation behavior was compared with experimental results. Theoretical calculations are in a good qualitative agreement with experimental data. Based on proposed approach, the incident angle of primary X-rays can be evaluated in the experiment. [DOI: 10.1380/ejssnt.2006.579]
