e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ALC07-
Electron Emission from Insulators Irradiated by Slow Highly Charged Ions
Walter MeisslDaniel WinklehnerFriedrich AumayrMartin C. SimonRainer GinzelJosé R. Crespo López-UrrutiaJoachim UllrichBeate SollederChristoph LemellJoachim Burgdörfer
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2008 Volume 6 Pages 54-59

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Abstract

Total electron emission yields have been measured for the first time resulting from impact of slow highly charged Arq+ (q ≤ 17), Xeq+ (q ≤ 50) and Hgq+ (q ≤ 68) ions on clean insulating LiF(001) and CaF2(111) surfaces at various impact angles. The surprisingly large yields show that even for the highest projectile charge states, a local charge-up of the surface poses no barrier for electron emission. We demonstrate that this is due to a strong sub-surface contribution in the potential electron emission process which is considerably more efficient in insulators because of the increased inelastic mean free path and the production of secondary electrons. [DOI: 10.1380/ejssnt.2008.54]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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