e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ISSS-5-
The Method of Identification of 2D→3D Phase Transition
S. A. DotsenkoN. G. GalkinE. A. Chusovitin
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JOURNAL FREE ACCESS

2009 Volume 7 Pages 186-190

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Abstract

In the article the method of identification of 2D→3D structure phase transition developed for differential reflection spectroscopy is presented. This phase transition was shown to be accompanied by non-linear dependence of differential reflectance Δ R/R versus deposited film thickness h. Formulas were derived for calculation of optical function of 2D and 3D structures involved in phase transition. Use of method for Cr/Si(111) system resulted in obtaining new information about Cr film growth. [DOI: 10.1380/ejssnt.2009.186]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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