e-Journal of Surface Science and Nanotechnology
Online ISSN : 1348-0391
ISSN-L : 1348-0391
Conference -ICSFS-14-
Scanning Probe Microscopy of ZnO Nanobelts
T. G. G. MaffeïsM. W. PennyM. R. BrownK. W. LiewD. FuN. TsolakoglouC. J. WrightS. P. Wilks
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JOURNAL FREE ACCESS

2009 Volume 7 Pages 323-326

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Abstract

We present an AFM and STM-STS investigation of the surface of ZnO nanobelts grown by chemical vapour deposition. AFM images showed a type 1 (high aspect ratio) nanobelt lying across a type 2 (low aspect ratio) nanobelt, bending at an angle of 20.9° without breaking. Terraces 10 atomic layer thick were also observed, with step edges running along the [0010] direction. STM images confirmed the AFM results while STS curves and current maps showed higher conductivity for the ZnO nanobelts than for the oxidised silicon surface, as well as an n-type behaviour. [DOI: 10.1380/ejssnt.2009.323]

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この記事はクリエイティブ・コモンズ [表示 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by/4.0/deed.ja
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