2009 Volume 7 Pages 362-365
The Ag-TeO2-ZnTe MIS structures have been fabricated, and the current-voltage and the emission characteristics were investigated. The TeO2, the natural oxide of the ZnTe substrates is used as the insulating layer, which is shown by the XPS measurement of the substrate surfaces before and after the diluted NH4Cl etching. The MIS structure gives a clear rectifying behavior. Strong electroluminescence (EL) is observed under forward biases at room temperatures; the threshold voltage is about 16 V and the EL intensity increases up to 20 V. The EL spectrum starts from about 550 nm wavelength. The forward current increases and the EL intensity decreases as the temperature is increased. Plural current models explain both the bias and the temperature dependence of the EL intensities. [DOI: 10.1380/ejssnt.2009.362]