Errata
Erratum: Epitaxial Growth of Bi(111) on Si(001) [e-J. Surf. Sci. Nanotech. Vol. 7, pp. 441-447 (2009)]
G. Jnawali, H. Hattab, C. A. Bobisch, A. Bernhart, B. Krenzer, E. Zubkov, C. Deiter, T. Weisemoeller, F. Bertram, J. Wollschläger, R. Möller, M. Horn-von Hoegen
Author information
Keywords:
Bismuth,
Low-energy electron diffraction (LEED),
Dislocation,
Scanning tunneling microscopy (STM),
Heteroepitaxy,
X-ray diffraction,
X-ray reflectivity
2009 Volume 7 Pages 795
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