IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
LETTER
A novel single event upset hardened CMOS SRAM cell
Guohe ZhangJun ShaoFeng LiangDongxuan Bao
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2012 Volume 9 Issue 3 Pages 140-145

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Abstract

This paper presents an improved design of a radiation-hardened static random access memory (SRAM). The simulation results based on the 0.18µm standard digital CMOS technology show that its static current drops dramatically compared with the WHIT cell, and the write speed is equivalent to that of other cells. The memory cell is extremely tolerant to logic upset as it does not flip even for a transient pulse with 100 times the critical charge of the ROCK cell. According to these features, this novel cell suits high reliability applications, such as aerospace and military.

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© 2012 by The Institute of Electronics, Information and Communication Engineers
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