IEICE Electronics Express
Online ISSN : 1349-2543
ISSN-L : 1349-2543
REVIEW PAPER
ReRAM technology; challenges and prospects
Hiro AkinagaHisashi Shima
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JOURNAL FREE ACCESS

2012 Volume 9 Issue 8 Pages 795-807

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Abstract

We review recent progresses in Resistive Random Access Memory (ReRAM) technologies together with difficult challenges and prospects. ReRAM is one of the most promising emerging nonvolatile memories, in which both electronic and electrochemical effects play important roles in the nonvolatile functionalities. First, a brief historical overview of the research is provided. The technological overview is reported with the epoch-making achievements. Second, the current understanding in terms of the operation mechanism is shown followed by the technical assessment, especially the advantages of ReRAM. Finally, we summarize the challenges facing the ReRAM technology and the prospects.

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© 2012 by The Institute of Electronics, Information and Communication Engineers
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