2007 年 31 巻 3 号 p. 193-197
With high quality thin films of the double perovskite Sr2CrReO6, we have investigated an electronic state of the surface of the Sr2CrReO6 thin film and the interface of bi-layer Sr2CrReO6 / MgO or SrTiO3 film by X-ray photoemission spectroscopy (XPS). The Re 4f spectrum of Sr2CrReO6 has shown a multiple peak structure, which originates from the inherent electronic state of Re in half-metallic Sr2CrReO6. Moreover, it has been found that the electronic state in Sr2CrReO6 is preserved at the Sr2CrReO6 / MgO interface.