2001 年 22 巻 8 号 p. 522-529
For a vicinal Si(001) 2×1 surface, a row of extra spots has been clearly observed along the reciprocal lattice rod in energy-filtered reflection high-energy electron diffraction (ER-RHEED) pattern. The glancing angle dependence of these extra spots along (0 0), (1/2 0) and (1 0) rods was simulated by kinematical analysis based on a monatomic regular step surface. Behavior of these extra spots was reproduced well by the calculations and the mean terrace length along the [110] direction was estimated. It has been found that this method can evaluate very small vicinal angle near 0.1o, which is superior to low energy electron diffraction (LEED) method in this point.