表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:フォトニック結晶
プラズマプロセスによる半導体フォトニック結晶加工と表面処理
馬場 俊彦井下 京治市川 弘之
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2001 年 22 巻 11 号 p. 710-714

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Semiconductor photonic crystals are expected to realize the ultimate control of spontaneous emission, so-called Purcell effect. However, there are two important issues. One is a fine dry etching process for a high aspect ratio over 10 in submicron period structures. The other is a surface treatment for the reduction in surface recombination. With regard to these issues we have studied InP-based materials, since they have a low surface recombination velocity νs. We developed the etching process using the inductively coupled plasma. The surface recombination was evaluated through the lifetime measurement of photoluminescence at a wavelength over 1 µm using the phase resolved spectroscopy. We investigated various surface treatments and found that the CH4 plasma irradiation is effective for realizing crucial νs of 1×103 cm/s order. The SIMS analysis suggests that it is due to the electronic insulation near the surface by the shallow implantation of C.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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