表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:非接触原子間力顕微鏡—なにがどこまで見えるか?—
DNAのナノスケール構造と電子状態
松本 卓也前田 泰内藤 泰久川合 知二
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2002 年 23 巻 3 号 p. 178-185

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Non-contact atomic force microscopy (NC-AFM) has been employed to observe double-stranded DNA. Cu(111) surface is found to be useful to realize high-resolution imaging of DNA molecules without the effect of water-layer and to improve the tip shape during the scan for imaging. NC-AFM images reveal the double-helix structure whose averaged repeat distance agrees with Watson-Crick model. However, the observed height of DNA molecules is only 1 nm that is the half of natural diameter of double-stranded DNA suggesting the strong deformation due to the surface adsorption. The simultaneous measurements of frequency-shift and tunneling current indicate that DNA molecules show tunneling conductivity across the strand with the attenuation factor β = 1.1.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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