表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:低エネルギー電子顕微鏡/光電子顕微鏡の開発と応用
低速電子顕微鏡によるSi(111)表面での質量輸送の研究
日比野 浩樹Changwu HU荻野 俊郎Ignatius S.T. TSONG
著者情報
ジャーナル フリー

2002 年 23 巻 5 号 p. 277-284

詳細
抄録

Decay kinetics of two-dimensional islands and holes with diameters of a few micrometers to ∼100 nanometers on Si(111) was studied by low-energy electron microscopy close at the “1×1”-to-7×7 phase transition temperature. It is shown that the decay is governed by diffusion rather than attachment/detachment of the atoms at steps. Comparison of the decay rates of island and hole indicates that there is an upper limit for the Ehrlich-Schwoebel barrier. We also show that the surface mass diffusion constant on 7×7 is smaller than that on “1×1”. Slower surface mass diffusion on 7×7 than on “1×1”, coupled with preferential formation of 7×7 on the upper terrace of a step, produces a diffusion barrier during the phase transition, resulting in an asymmetry in the thermal decay rate between island and vacancy island. The diffusion barrier also causes the mass flow induced by the atom density difference between “1×1” and 7×7 asymmetric in the step-up and step-down directions.

著者関連情報

この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
前の記事 次の記事
feedback
Top