表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:半導体表面界面形成の微視的理解における理論の進展
水素終端Si表面におけるGe成長の理論
奈良 純大野 隆央
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2002 年 23 巻 2 号 p. 81-87

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Adsorption and diffusion of Ge atoms on a H/Si(001)-(2×1) surface is investigated by using first-principles total energy calculations and kinetic Monte Carlo simulations. The site exchange between the Ge adatom and substrate Si atoms has a significant effect on the energetics and the kinetics. We found that there are a number of adsorption geometries available for Ge atoms and that the dominant adsorption geometry temporally varies depending on the substrate temperatures. Ge atoms diffuse not on the surface but in the subsurface region. The diffusion species changes from Ge atoms to Si atoms at higher temperatures, resulting in formation of Ge-Si dimers or Si-Si dimers in the initial growth stage. These findings imply that transient states may have an important effect on the Ge growth.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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