表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
特集:表面分析の国際標準化
XPSおよびAES電子分光器の校正法に関するISO規格
橋本 哲
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2003 年 24 巻 4 号 p. 227-232

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International standards of XPS and AES spectrometers have been established. Binding energy scale calibration for XPS spectrometers was standardized as ISO 15472. The calibration of kinetic energy scale for AES spectrometers was standardized as ISO 17973 and 17974. The calibrations for the intensity scale are now discussing. The calibrations for the XPS and AES spectrometers were reviewed. The standard for XPS spectrometers specifies the calibration methods to estimate uncertainty with 95% reliability using repeatability and the linearity of binding energy scale and to correct the binding energy scales. This standard also specifies the method to establish the calibration schedule. Moreover, the standards on AES spectrometers specify the calibrations with high energy resolution for the chemical state analysis and the calibration with the medium energy resolution for elemental analysis.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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