表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
論文
相対論的X線光電子回折理論
藤川 高志小西 健久
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2003 年 24 巻 8 号 p. 468-473

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A theoretical framework for calculating XPD intensity that incorporates relativistic effect is developed. The theory is applicable to the cases where relativistic effects become important, for example, such a case as heavy elements (Z > 50) are present or circularly polarized photons are used in initial excitation of photoelectrons. The theory is based on short-range-order-multiple-scattering approach so that it is practically useful in analyzing experimental data in order to obtain structural information. In this framework relativistic Dirac Green's function is expanded in terms of full non-relativistic Green's functions using Gestzesy expansion. Using this formalism explicit formulae for spin-resolved XPD from s (l = 0) core levels are given by truncating the expansion at first few terms, which is sufficient in most cases. Numerical examples for direct (atomic) photoemission and single scattering XPD in two-atom models are presented. The theory has an advantage that we can use well-defined Debye-Waller factors and optical potentials developed within the framework of non-relativistic theory because the expansion is possible in terms of non-relativistic Green's functions.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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