X-ray magnetic circular dichroism (XMCD) is a powerful method to study the magnetic properties of magnetic thin films. However it provides depth-averaged information. Recently, we have developed a simple but effective depth-resolved technique in XMCD by using an imaging type microchannel plate detector. The performance of this method is demonstrated by applying to the depth-resolved analyses of Ni/Cu(100) and the effect of CO adsorption on Ni/Cu(100), Fe/Cu(100) and Fe/Ni/Cu(100) magnetic thin films. For Ni/Cu(100), magnetic orbital moments of the surface and internal layers are extracted to give deep insight for the spin reorientation transitions. For 7 ML Fe/Cu(100), the surface two layers are ferromagnetically coupled, while the inner layers are non-magnetic at 200 K and are in the spin density wave (SDW) state at 130 K. For Fe/Ni/Cu(100), magnetically live surface layers and some thickness-dependent magnetic coupling between the Fe surface and Ni film have been observed.