表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
ポピュラーサイエンス
亜鉛めっきのホイスカ抑止について
大河原 薫室井 良一
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2005 年 26 巻 3 号 p. 165-170

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Spontaneous growth of whiskers from electroplated zinc is known to occur at room temperature. Since whiskers may occasionally cause short-circuiting, prevention of the whisker growth is a technologically important problem in the electronics industry. Recently, a new problem that zinc whiskers from zinc plated props at raised access floor are transported into a computer through the cooling fan and cause shut down of the computer, is occurred. High concentrations of cyanide in zinc baths contribute to the role of the brightener and lead to declined internal stress levels in the plating, which significantly affects the inhibition of whisker growth.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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