抄録
We have developed a scanning tunneling microscope (STM) combined with a synchrotron-radiation light source (SR-STM) aiming at elemental analysis in a spatial resolution of STM. Using SR-STM atomically resolved STM images under the irradiation and also X-ray adsorption spectra clearly showing an adsorption edge of a substrate were successfully obtained by detecting photo-emitted electrons with the STM tip. In order to focus the probing area of the photo-induced current, a glass-coated metal tip sharpened with focused ion beam was used as a probe. The present situation and prospects of the instrument are discussed in this review.
