表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
論文
Auクラスター一次イオン源を用いたTOF-SIMS測定における二次イオン強度増大効果
工藤 正博相本 健一加藤 信彦青柳 里果飯田 典子山本 公
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2006 年 27 巻 9 号 p. 518-522

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Enhancement of the secondary ion intensity in the TOF-SIMS spectra obtained by Au+ and Au3+ bombardment was investigated in comparison with Ga+ excitation using polymer samples with different molecular weight distributions. Since the polymer samples used in this experiment have wide molecular weight distributions, the advantages of a gold cluster primary ion source over a monoatomic ion source could systematically be evaluated. It was found that a Au primary ion source for a TOF-SIMS instrument has advantages in such terms as (1) the mass effect of the monoatomic primary ion, i.e., Au+ vs. Ga+, (2) the cluster primary ion effect of Au3+ compared with Au+ and Ga+, and (3)decrease in the degree of fragmentation by usage of a cluster primary ion beam compared with a monoatomic ion beam.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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