表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
論文
極薄Si酸化膜上Geナノドットの界面構造と閉じ込めポテンシャル
中山 泰生松田 巌長谷川 修司市川 昌和
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2006 年 27 巻 9 号 p. 523-529

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Quantum confinement effect in the valence band of Ge nanodots, fabricated onto an ultrathin SiO2 film on Si(111) substrate, was clearly measured by means of photoemission spectroscopy. Dot-size dependent shifts of the highest occupied state were well described by quantized energy levels of confined holes by the spherical parabolic potential. Two-types of Ge nanodots with different interface conditions, named as ‘epitaxial’ and ‘non-epitaxial’, can be fabricated depending on the growth temperature. The actual confining potentials for the quantum states in the two-types of Ge nanodots were evaluated, which clearly indicates drastic reduction of the confining potential barrier height for the epitaxial dots owing to voids formed in the interface SiO2 layer just below the Ge nanodots.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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