Using room-temperature (RT) site-specific force spectroscopy F(Z), we developed a nondestructive single-atom chemical identification method at RT, which is independent of tip, topography (height difference) and chemical coordination, but dependent on atom species, with atomic resolution. We demonstrated atom-by-atom chemical identification of intermixed individual atoms on a Pb/Sn/Si(111)-(√3×√3) alloy surface. Further, we developed a method for RT site-specific force curve measurements F(Z) to apply to RT force mapping F(X, Z). From RT site-specific frequency-shift maps Δf(X, Z) of a Si(111)-(7×7) surface, we deduced normal force maps F_Z(X, Z), then potential maps U(X, Z), and finally lateral force map F_X(X, Z), successively. Thus, we obtained not only potential maps, but also lateral force maps of the Si(111)-(7×7) surface under noncontact region at RT on an atomic scale.