表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
論文
光電子収量分光法の絶縁物への適用とルブレン薄膜酸化過程のその場観察への応用
町田 真一中山 泰生石井 久夫
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ジャーナル フリー

2008 年 29 巻 9 号 p. 543-549

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For the purpose of close understanding and further improvement of the organic electronics devices, elucidation of the electronic structures of organic-electrode interfaces as well as the organic materials themselves in the ambient pressure condition is highly anticipated. Ultraviolet Photoelectron spectroscopy (UPS) is not a satisfactory technique for this purpose, because UPS needs high vacuum condition in principle and the sample charging problem hinders characterization of the electronic structures of specimens of insufficient conductivity (e.g. organic thick-films and crystals). In the present study, the authors proved that one can observe the occupied electronic structures of insulating materials by photoelectron yield spectroscopy (PYS). A novel mechanism enabling photoelectron measurement on insulators is specified. By adopting this method, the electronic structures of rubrene thin films at a buried interface beneath the rubrene-peroxide layers were directly observed in the ambient air condition. These merits of PYS can be extended to investigate the electronic structure of organic devices.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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