表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
論文
ナノスケールの4端子抵抗測定における量子干渉効果の理論研究
寺澤 麻子飛松 啓司多田 朋史山本 貴博渡邉 聡
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2010 年 31 巻 8 号 p. 374-379

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To analyze the interference effects on the oscillation of four-probe resistance of one-dimensional nanostructures in experiments, we performed numerical simulation of a nanoscale four-probe system consisting of monatomic carbon chains using self-consistent charge density-functional tight-binding method and nonequilibrium Green's function method. We constructed spectra of the peak spacing of calculated four-probe resistance spectra, and compared them with those expected from a simple model of interference due to multiple reflections between sample-probe contacts. From the peak spacing spectra, the interference effects caused by the multiple reflections and by resonant scattering at the sample-probe contacts are extracted separately. This result suggests that the peak spacing analysis is a potential tool to understand four-probe resistance measurements.

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この記事はクリエイティブ・コモンズ [表示 - 非営利 4.0 国際]ライセンスの下に提供されています。
https://creativecommons.org/licenses/by-nc/4.0/deed.ja
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