Hyomen Kagaku
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Profile-Imaging of Cleavage Plane Surfaces of Bi-Based Superconductors by Means of High-Resolution Transmission Electron Microscopy
Yoshio MATSUIShunji TAKEKAWAShigeo HORIUCHI
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JOURNAL FREE ACCESS

1990 Volume 11 Issue 6 Pages 365-367

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Abstract

Cleavage plane surfaces of oxide superconductors, Bi2Sr2CuOν (2201 phase, Tc=20 K) and Bi2Sr2-Ca2Cu3Oν (2223 phase, Tc= 110 K), are examined by the high-resolution electron microscope profile imaging method. It is confirmed that the surfaces consist of single Bi0 plane indicating that the crystal is cleaved in the middle of two (BiO) 2 layers. It is also confirmed that incommensurate modulation in the bulk structure is preserved even at the cleavage plane to form wavy surface structure. The results are almost consistent with those previously reported for Bi2Sr2CaCu2Oν (2212 phase, Tc = 80 K).

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© The Surface Science Society of Japan
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