表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
STMによるGaAs(110)劈開面の観察
福田 常男鈴木 峰晴
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ジャーナル フリー

1991 年 12 巻 5 号 p. 268-271

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Observation of cleaved GaAs (110) surfaces is performed by scanning tunneling microscopy in ultrahigh vacuum. Monoatomic steps and anomalously large corrugation regions of a few tens of square angstroms in the atomically flat terrace are observed. Since the number of the large corrugations corresponds to the number of the dopant within a few atomic layers, these corrugation regions are probably induced by the dopant. Voltage-dependent morphology, which originates from the local density of states of each constituent at the surface, is also discussed.

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