High-Resolution Transmission Electron Microscope Study of Surface Structures of Bi-Based Complex Oxides

Kasumi YANAGISAWA; Yoshio MATSUI; Kaoru SHODA; Eiji TAKAYAMA-MUROMACHI; Sigeo HORIUCHI

doi:10.1380/jsssj.13.5_275

Kasumi YANAGISAWA, Yoshio MATSUI, Kaoru SHODA, Eiji TAKAYAMA-MUROMACHI, Sigeo HORIUCHI

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JOURNAL FREE ACCESS

1992 Volume 13 Issue 5 Pages 275-278

DOI https://doi.org/10.1380/jsssj.13.5_275

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Abstract

Terraced surfaces of Bi-Co complex oxide, (Bi, Pb)₂Sr₂CoO_y, are examined by means of high-resolution transmission electron microscope (HRTEM) profile imaging method. The outermost surface of each step is a single (BiO) layer, which preserves wavy fluctuations of atom-plane almost in the same manner as those in the bulk-modulation. Some of (BiO)-layers near the edge of the crystal are not double but single (BiO) layers. In addition, an extremely small crystal of Bi₂ (Sr, Ca)₃Cu₂O_y with unit-cell-size width is found to have the modulated structure almost identical with the bulk-modulation.

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