表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
同軸形直衝突イオン散乱分光法(CAICISS)によるMoS2の表面構造解析
門脇 靖秋鹿 研一近藤 寛野副 尚一
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ジャーナル フリー

1992 年 13 巻 5 号 p. 314-316

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Natural MoS2 (001) surface structure was investigated by coaxial impact-collision ion scattering Spectroscopy (CAICISS), low energy electron diffraction (LEED) and Auger electron spectroscopy (AES) under ultra high vacuum. It was found that the surface reconstruction of MoS2 (001) does not occur. There is the same stacking sequence (2H structure) in the bulk. However, we found the contractions of 3.6±0.4% at the top surface interlayer (d12) and of 0∼2% at the subsequent interlayer (d23).

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