表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
フォトルミネッセンス法によるZnSe/CdSe単一量子井戸界面における混晶化の評価
吉原 弘明竹林 和久朱 自強八百 隆文
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1993 年 14 巻 2 号 p. 100-104

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The interface in a binary single quantum-well (SQW) structure of ZnSe/CdSe, where CdSe less than one monolayer is sandwiched by ZnSe layers (submonolayer SQW), is characterized by means of photoluminescence scpectroscopy. The dependence of the energy, linewidth and intensity of excitonic emission from the submonolayer SQWs on the well thickness of CdSe is extensively investigated. The characteristics of the excitonic emission are interpreted in terms of alloy formation at the interface. It is clarified that the ZnCdSe alloy is formed at the interface in ZnSe/CdSe quantum well heterostructure.

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