試料のおがみや残留微小磁場がある場合のLEED I(V)曲線測定
1993 年 14 巻 1 号 p. 41-47
詳細
1993 年 14 巻 1 号 p. 41-47
LEED I(V) curves have been measured on Cu (001) under existence of sample tilt and residual weak magnetic field. It is demonstrated that “horizontal-beam method” can reduce the effect of beam misalignment. The validity of this method is discussed and the data obtained by using this method is shown.
