In-situ Observation of Fullerene Ultrathin Films by Using Total Reflection X-ray Diffraction-Organic Molecular Beam Deposition Method (TRXD-OMBD)

Yuji YOSHIDA; Nobutaka TANIGAKI; Kiyoshi YASE

doi:10.1380/jsssj.18.178

全反射X線回折-有機分子線蒸着法(TRXD-OMBD)によるフラーレン超薄膜のその場観察

吉田郵司, 谷垣宣孝, 八瀬清志

著者情報

ジャーナルフリー

1997 年 18 巻 3 号 p. 178-184

DOI https://doi.org/10.1380/jsssj.18.178

詳細

発行日: 1997/03/10 受付日: 1996/05/17 J-STAGE公開日: 2009/08/07 受理日: 1996/05/17 早期公開日: - 改訂日: -
訂正情報
訂正日: 2009/08/07 訂正理由: - 訂正箇所: 論文抄録訂正内容: Wrong : For the purpose of confirming the growth mechanism of organic ultrathin films prepared by organic molecular beam deposition (OMBD), we employed a new combined system of total reflection X-ray diffraction method (TRXD) and OMBD. By using this system (TRXD-OMBD), the in-situ observation of cohesive structures and growth modes in organic ultrathin films were performed. In this study, the in-plane structure and orientation of fullerene (C60) ultrathin films epitaxially grown on oriented silver (Ag) surfaces were examined during the deposition. It was confirmed that the C60 ultrathin film formed the hexagonal closed packed (hcp) structure and the epitaxial structure of C60 on the Ag (111) surface occurred at the thickness of a few nanometer, namely the (2√3× 2√3) R30° structure as a stable state. Further, the growth modes of C60 ultrathin films were examined by the in-situ observation of total reflection fluorescence X-rays of Ag. In this paper, we noted the possibility of various analysis on organic ultrathin films and surfaces by our TRXD-ONBD system.
Right : For the purpose of confirming the growth mechanism of organic ultrathin films prepared by organic molecular beam deposition (OMBD), we employed a new combined system of total reflection X-ray diffraction method (TRXD) and OMBD. By using this system (TRXD-OMBD), the in-situ observation of cohesive structures and growth modes in organic ultrathin films were performed. In this study, the in-plane structure and orientation of fullerene (C60) ultrathin films epitaxially grown on oriented silver (Ag) surfaces were examined during the deposition. It was confirmed that the C60 ultrathin film formed the hexagonal closed packed (hcp) structure and the epitaxial structure of C60 on the Ag (111) surface occurred at the thickness of a few nanometer, namely the (2√3× 2√3) R30° structure as a stable state. Further, the growth modes of C60 ultrathin films were examined by the in-situ observation of total reflection fluorescence X-rays of Ag. In this paper, we noted the possibility of various analysis on organic ultrathin films and surfaces by our TRXD-ONBD system.

訂正日: 2009/08/07 訂正理由: - 訂正箇所: 引用文献情報訂正内容: Wrong : 1) M. Seul, P. Eisenberger and H.M. McConnell: Proc. Natl. Acad. Sci. U.S.A. 80, 5795 (1983).
2) K. Kjaer, J. Als-Nielsen, C.A. Helm, C.A. Laxhuber and H. Möhwald: Phys. Rev. Lett. 58, 2224 (1987).
3) J. Als-Nielsen, D. Jacquemain, K. Kjaer, F. Leveiller, M. Lahav and L. Leiserowitz: Phys. Rep. 246, 251 (1994).
4) T. Horiuchi, K. Fukao and K. Matsushige: Jpn. J. Appl. Phys. 26, L1839 (1987).
5) K. Ishida, K. Hayashi, T. Horiuchi and K. Matsushige: J.Appi. Phys. 73, 7338 (1993).
6) N. Tanigaki, K. Yase, Y. Yoshida, Y. Kyotani and A. Kaito: Rept. Prog. Polym. Phys. Jpn. 38, 269 (1995).
7) K. Sakurai and A. Iida: Jpn. J. Appi. Phys. 31, L113 (1992).
8) Y. Yoshida, N. Tanigaki and K. Yase: Mol. Cryst. Liq. Cryst. 280, 271 (1996).
9) Y. Yoshida, N. Tanigaki and K. Yase: Thin Solid Films 281/282, 80 (1996).
10) H.W. Kroto, J.R. Heath, S.C. O'Brien, R.F. Curl and R.E. Smally: Nature 318,162 (1985).
11) K. Tanigaki, S. Kuroshima and T.W. Ebbesen: Thin Solid Films 257,154 (1995).
12) E.I. Altman and R. Colton: Surf. Sci. 295,13 (1993).
13) T. David, J. K. Gimzewski, D. Purdie, B. Reihl and R.R. Schlittler: Phy. Rev. B 50, 5810 (1994).
14) A. Fartash: Mat. Res. Soc. Symp. Proc. 359, 393 (1995).
16) L.G. Parratt: Phys. Rev. 95, 359 (1954).
17) H. Dosch: Phys. Rev. B 35, 2137 (1987).
19) S. Hasegawa, H. Daimon and S. Ino: Surf. Sci. 186, 138 (1987).

Right : 1) M. Seul, P. Eisenberger and H.M. McConnell: Proc. Natl. Acad. Sci. U.S.A. 80, 5795 (1983).
2) K. Kjaer, J. Als-Nielsen, C.A. Helm, C.A. Laxhuber and H. Möhwald: Phys. Rev. Lett. 58, 2224 (1987).
3) J. Als-Nielsen, D. Jacquemain, K. Kjaer, F. Leveiller, M. Lahav and L. Leiserowitz: Phys. Rep. 246, 251 (1994).
4) T. Horiuchi, K. Fukao and K. Matsushige: Jpn. J. Appl. Phys. 26, L1839 (1987).
5) K. Ishida, K. Hayashi, T. Horiuchi and K. Matsushige: J.Appi. Phys. 73, 7338 (1993).
6) N. Tanigaki, K. Yase, Y. Yoshida, Y. Kyotani and A. Kaito: Rept. Prog. Polym. Phys. Jpn. 38, 269 (1995).
7) K. Sakurai and A. Iida: Jpn. J. Appi. Phys. 31, L113 (1992).
8) Y. Yoshida, N. Tanigaki and K. Yase: Mol. Cryst. Liq. Cryst. 280, 271 (1996).
9) Y. Yoshida, N. Tanigaki and K. Yase: Thin Solid Films 281/282, 80 (1996).
10) H.W. Kroto, J.R. Heath, S.C. O'Brien, R.F. Curl and R.E. Smally: Nature 318,162 (1985).
11) K. Tanigaki, S. Kuroshima and T.W. Ebbesen: Thin Solid Films 257,154 (1995).
12) E.I. Altman and R. Colton: Surf. Sci. 295,13 (1993).
13) T. David, J. K. Gimzewski, D. Purdie, B. Reihl and R.R. Schlittler: Phy. Rev. B 50, 5810 (1994).
14) A. Fartash: Mat. Res. Soc. Symp. Proc. 359, 393 (1995).
16) L.G. Parratt: Phys. Rev. 95, 359 (1954).
17) H. Dosch: Phys. Rev. B 35, 2137 (1987).
19) S. Hasegawa, H. Daimon and S. Ino: Surf. Sci. 186, 138 (1987).

抄録

For the purpose of confirming the growth mechanism of organic ultrathin films prepared by organic molecular beam deposition (OMBD), we employed a new combined system of total reflection X-ray diffraction method (TRXD) and OMBD. By using this system (TRXD-OMBD), the in-situ observation of cohesive structures and growth modes in organic ultrathin films were performed. In this study, the in-plane structure and orientation of fullerene (C60) ultrathin films epitaxially grown on oriented silver (Ag) surfaces were examined during the deposition. It was confirmed that the C60 ultrathin film formed the hexagonal closed packed (hcp) structure and the epitaxial structure of C60 on the Ag (111) surface occurred at the thickness of a few nanometer, namely the (2√3× 2√3) R30° structure as a stable state. Further, the growth modes of C60 ultrathin films were examined by the in-situ observation of total reflection fluorescence X-rays of Ag. In this paper, we noted the possibility of various analysis on organic ultrathin films and surfaces by our TRXD-ONBD system.

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