表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
AES/XPS定性分析ソフトウェアの開発とその応用
長塚 義隆吉田 康二長澤 勇二小野 芳章
著者情報
ジャーナル フリー

1998 年 19 巻 7 号 p. 446-452

詳細
抄録

Using spectral data processing techniques based mainly on the statistical theory, some attempts are made to develop a practical AES/XPS qualitative analysis software including how to make the precise peak detection and adequate transition line assignment, and to obtain the reasonable identification results finally. The present software is applied to some typical spectra data as well as the public VAMAS format data downloaded through the network from the Common Data Processing System (COMPRO). Good analysis results are generally obtained for simple samples, but still some problems remain for complex samples. We are trying to solve these problems one by one with the aid of statistical theory and/or heuristic knowledge of analysis experts.

著者関連情報
© 社団法人 日本表面科学会
前の記事 次の記事
feedback
Top