表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
自己組織化によるSiナノ構造のウェーハスケール制御
荻野 俊郎本間 芳和日比野 浩樹小林 慶裕住友 弘二Kuniyil PRABHAKARAN尾身 博雄
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1998 年 19 巻 9 号 p. 557-564

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Wafer-scale control of nanofabrication on Si using selforganization processes are described. Unit cells of surface reconstruction, atomic steps, and domain boundaries of the reconstruction can be used as templates to control arrangement of self-organized nanostructures. We demonstrate that atomic-step network can be organized by controlling the step motion during surface atom evaporation, employing etched patterns formed by lithographic technique. Step/domainboundary network can be modified by using step-flow growth. Ge quantum dot network is self-formed on the surface with well organized templates. Strain distribution on the substrate surface is important for the size and shape control of Ge quantum dots. Chemical reaction control plays an important role in fabricating semiconductor-insulator-conductor nanostructures. In Si/Ge nanostructure, reaction selectivities between Si and Ge can be utilized to form oxide and silicide layers at the Si/Ge interfaces.

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