表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
アルミニウムの酸化皮膜のオージエ電子分光による分析
田上 満小田 武彦宮元 幸博大高 好久
著者情報
ジャーナル フリー

1981 年 2 巻 3 号 p. 218-223

詳細
抄録

As references for use in trouble shooting concerning industrial aluminum products, depth profiles of typical surfaces of diverse specimens obtained using an Auger electron spectrometer furnished with an argon sputter ion gun are presented. The data consist of depth profiles of a (1) surface frozen during exposure to air, (2) surface frozen while in contact with an iron mould, (3) water cooled surface, (4) rolled surface, (5) weathered surface, (6) extrusion surface, (7) chromated surface, (8) anodized surface and a (9) lathed surface. The following is on the whole noteworthy : (A) Thicknesses of oxide films are very small : 8 nm for sample (1), 50 nm for sample (3). This is not expected to result from the susceptibility a corrosion of aluminum. (B) The industrially produced surfaces show little contamination. Contaminants do not completely cover even the surface of sample (4). (C) Magnesium tends to segregate in the oxide films.

著者関連情報
© 社団法人 日本表面科学会
前の記事 次の記事
feedback
Top