Development of a Hybrid Scanning Near-field Optical/Tunneling Microscope (SNOM/STM) System

Ken NAKAJIMA; Ruggero MICHELETTO; Keita MITSUI; Takashi ISOSHIMA; Masahiko HARA; Tatsuo WADA; Hiroyuki SASABE; Wolfgang KNOLL

doi:10.1380/jsssj.20.509

近接場光学顕微鏡/走査型トンネル顕微鏡複合装置の開発

中嶋健, Ruggero MICHELETTO, 三井圭太, 礒島隆史, 原正彦, 和田達夫, 雀部博之, Wolfgang KNOLL

著者情報

ジャーナルフリー

1999 年 20 巻 8 号 p. 509-515

DOI https://doi.org/10.1380/jsssj.20.509

詳細

発行日: 1999/08/10 受付日: 1999/02/17 J-STAGE公開日: 2009/08/07 受理日: 1999/05/15 早期公開日: - 改訂日: -
訂正情報
訂正日: 2009/08/07 訂正理由: - 訂正箇所: 論文抄録訂正内容: Wrong : A scanning near-field optical microscope (SNOM) combined with a scanning tunneling microscope (STM) is used to investigate nanoscopic optical phenomena both in the near-field region and in the proximity. The system is realized by introducing a doubly metal-coated optical fiber tip with an extremely small aperture, on which metal-coating is performed to obtain a half-transparent conducting tip. A simultaneous SNOM/STM observation is performed for an Au (111) surface, where the evanescent field standing on the tip vicinity through the aperture is scattered by the local structures of the sample and the far-field component of the scattered light is collected as an optical signal. The distance con-trol is carried out under constant current condition in order to separate the optical properties from surface topography. λ/100 optical resolution and the identical channel transport both for electrons and photons are achieved.
Right : A scanning near-field optical microscope (SNOM) combined with a scanning tunneling microscope (STM) is used to investigate nanoscopic optical phenomena both in the near-field region and in the proximity. The system is realized by introducing a doubly metal-coated optical fiber tip with an extremely small aperture, on which metal-coating is performed to obtain a half-transparent conducting tip. A simultaneous SNOM/STM observation is performed for an Au (111) surface, where the evanescent field standing on the tip vicinity through the aperture is scattered by the local structures of the sample and the far-field component of the scattered light is collected as an optical signal. The distance con-trol is carried out under constant current condition in order to separate the optical properties from surface topography. λ/100 optical resolution and the identical channel transport both for electrons and photons are achieved.

訂正日: 2009/08/07 訂正理由: - 訂正箇所: 引用文献情報訂正内容: Wrong : 1) D.W. Pohl, W. Denk and M. Lanz: Appl. Phys. Lett. 44,651 (1984).
2) E. Betzig, M. Issacson and A. Lewis: Appl. Phys. Lett. 51,2088 (1987).
3) E. Betzig and J.K. Trautman: Science 257,189 (1992).
4) G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49,57 (1982).
5) U. Dürig, D.W. Pohl and F. Rohner: J. Appl. Phys. 59,3318 (1986).
6) Y. Inoue and S. Kawata: J. Microscopy 14,178 (1994).
7) K. Lieberman and A. Lewis: Appl. Phys. Lett. 62,1335 (1993).
8) M.G. Parajo, E. Cambril and Y. Chen: Appl. Phys. Lett. 65,1498 (1994).
9) B. Hecht, H. Bielefeldt, Y. Inoue, D.W. Pohl and L. Novotny: J. Appl. Phys. 81, 2492 (1997).
10) S. Mononobe, M. Naya, T. Saiki and M. Ohtsu: Appl. Opt. 36,1496 (1997).
11) K. Nakajima, R. Micheletto, K. Mitsui, T. Isoshima, M. Hara, T. Wada, W. Knoll and H. Sasabe: Mol. Cryst. Liq. Cryst. 322,209 (1998)
12) T. Pangaribuan, K. Yamada, S. Jiang, H. Ohsawa and M. Ohtsu: Jpn. J. Appl. Phys. 31, L 1302 (1992)
13) Y. Inoue and S. Kawata: Opt. Lett.19,159 (1994).
14) R. Micheletto, K. Nakajima, M. Geisler, M. Hara and W. Knoll: Appl. Surf. Sci.144-145,514 (1999).
15) H. Furukawa and S. Kawata: Opt. Commun. 132,170 (1996).
16) H. Hatano, Y. Inoue and S. Kawata: Opt. Lett. 22,1532 (1997).

Right : 1) D.W. Pohl, W. Denk and M. Lanz: Appl. Phys. Lett. 44,651 (1984).
2) E. Betzig, M. Issacson and A. Lewis: Appl. Phys. Lett. 51,2088 (1987).
3) E. Betzig and J.K. Trautman: Science 257,189 (1992).
4) G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel: Phys. Rev. Lett. 49,57 (1982).
5) U. Dürig, D.W. Pohl and F. Rohner: J. Appl. Phys. 59,3318 (1986).
6) Y. Inoue and S. Kawata: J. Microscopy 14,178 (1994).
7) K. Lieberman and A. Lewis: Appl. Phys. Lett. 62,1335 (1993).
8) M.G. Parajo, E. Cambril and Y. Chen: Appl. Phys. Lett. 65,1498 (1994).
9) B. Hecht, H. Bielefeldt, Y. Inoue, D.W. Pohl and L. Novotny: J. Appl. Phys. 81, 2492 (1997).
10) S. Mononobe, M. Naya, T. Saiki and M. Ohtsu: Appl. Opt. 36,1496 (1997).
11) K. Nakajima, R. Micheletto, K. Mitsui, T. Isoshima, M. Hara, T. Wada, W. Knoll and H. Sasabe: Mol. Cryst. Liq. Cryst. 322,209 (1998)
12) T. Pangaribuan, K. Yamada, S. Jiang, H. Ohsawa and M. Ohtsu: Jpn. J. Appl. Phys. 31, L 1302 (1992)
13) Y. Inoue and S. Kawata: Opt. Lett.19,159 (1994).
14) R. Micheletto, K. Nakajima, M. Geisler, M. Hara and W. Knoll: Appl. Surf. Sci.144-145,514 (1999).
15) H. Furukawa and S. Kawata: Opt. Commun. 132,170 (1996).
16) H. Hatano, Y. Inoue and S. Kawata: Opt. Lett. 22,1532 (1997).

抄録

A scanning near-field optical microscope (SNOM) combined with a scanning tunneling microscope (STM) is used to investigate nanoscopic optical phenomena both in the near-field region and in the proximity. The system is realized by introducing a doubly metal-coated optical fiber tip with an extremely small aperture, on which metal-coating is performed to obtain a half-transparent conducting tip. A simultaneous SNOM/STM observation is performed for an Au (111) surface, where the evanescent field standing on the tip vicinity through the aperture is scattered by the local structures of the sample and the far-field component of the scattered light is collected as an optical signal. The distance con-trol is carried out under constant current condition in order to separate the optical properties from surface topography. λ/100 optical resolution and the identical channel transport both for electrons and photons are achieved.

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