表面科学
Online ISSN : 1881-4743
Print ISSN : 0388-5321
ISSN-L : 0388-5321
Si微斜面での通電効果と表面形態
八木 克道出川 雅士西村 穂積鈴木 孝将箕田 弘喜谷城 康眞
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1999 年 20 巻 12 号 p. 830-836

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A systematic study of specimen heating current effects on Si(111) and (001) vicinal surfaces is summarized briefly in this paper. On the (111) surfaces current direction dependent step bunching and its temperature dependence reported elsewhere on small miscut surfaces were found to be valid also on vicinal surfaces with miscut angles more than 10°. We newly found that below 1200°C step wandering occurs under the current at which step bunching does not take place. On the (001) vicinal surfaces, step bunching independent of the current direction and anisotropy in current effects were observed.

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